The focus of the International GRK 1896 Satellite Symposium “In Situ Microscopy with Electrons, X-rays and Scanning Probes” at the ICEAM2017 lies on recent advances in the direct study of material processes under the influence of external stimuli such as temperature, mechanical strain, magnetic/electric fields and chemical environments and their simulation by scale-bridging modeling techniques. The symposium aims to provide a forum for discussion between researchers from the University of Erlangen-Nürnberg and abroad and distinguished invited experts, to promote the interdisciplinary exchange of new developments in the rapidly evolving field of complementary in situ microscopy and simulation techniques.
Chair of Micro- and Nanostructure Research
Prof. Erdmann Spiecker
Dr. Christian Wiktor
Phone: +49 9131 85-64065
Abstract submission deadline: August 31st, 2017.
More information concerning the symposium and registration can be found here.
Subject: Characterization and Modeling of Dopant Diffusion Under Process-Induced Stress.
The aim of the PhD is to reliably predict the impact of manufacturing process-induced stress on junction profile modification subsequent electrical parameters shifts on sub-micrometric electronic active devices. The job will involve physical and electrical characterization of dedicated, previously designed simple test structures with a view to assessing the nature and magnitude of mechanical stress and dopant diffusion. A critical review and improvement (if necessary) of state-of-the-art stress-dependent dopant diffusion models will pave the way to an accurate Technology Computer Aided Design (TCAD) simulation of realistic (that is, manufactured) electronic devices.
It will be performed in strong partnership with STMicroelectronics.
The ideal candidate has a Master Degree in Material Sciences (or equivalent), a solid background in semiconductor physics, good communication skills and is proficient in written and spoken English.
Deadline : September 2017
Starting year : 2017
PhD Advisor : Pr. Olivier Thomas, Email : email@example.com
Laboratory : IM2NP (http://www.im2np.fr/)
Industry : STMicroelectronics, Rousset–France (http://www.st.com)
Funding : CIFRE (3 years)
Location : Marseille (France), Rousset (France)
Applications should be sent by email to Prof. Olivier THOMAS (firstname.lastname@example.org) and/or Dr. Roberto SIMOLA (email@example.com).
More information on the subject can be found in the document below:
EMMC16 ( 16th European Mechanics of Materials Conference) aims at gathering researchers sharing a common interest in the field of mechanics of materials, yet working in a variety of application domains : material science, mechanical and civil engineering, but also biomechanics, geophysics, ...
Session 15 focus on Experimental nanomechanics :
Nano- and micromechanical testing coupled with advanced in situ techniques has attracted significant attention over the past decade because it permits (i) probing individual microstructure constituents and (ii) selectively activate mechanisms. Both is key to fundamentally understand plasticity and fracture of advanced multi-phase microstructures and small scale systems. The main objective of this thematic session is to gather specialists in the field of Nano- and Micromechanical testing to unravel mechanisms of plasticity and fracture at interfaces.
Characterization techniques envisioned comprise (but are not limited to) transmission electron microscopy (TEM), scanning electron microscopy (SEM) and synchrotron based techniques. The contributions should aim for understanding plasticity, fracture and fatigue at
- grain and phase boundaries
- amorphous / crystalline interfaces
- free surfaces
- multilayered systems
- super lattices.
This session is organized by Christoph Kirchlechner (MPIE, Düsseldorf, Germany) and Frédéric Mompiou (CEMES, Toulouse, France).
Abstract submission deadline: September 30, 2017.
More information are available to the following link : https://emmc16.sciencesconf.org/
The studentship is part of a funded project on refractive optics for X-ray wavefront correction being jointly undertaken by the University of Oxford (A.M. Korsunsky) and Diamond Light Source (K. Sawhney and D. Laundy).
Diamond Light Source (http://www.diamond.ac.uk) is the UK’s national synchrotron science facility. The facility provides intense beams of X-rays delivered along beamlines to diverse experiments. Specialised X-ray optical components are used to focus the X-rays into sub-micrometre focal spots to obtain high photon flux density and high spatial resolution at the sample. Currently the smallest X-ray spots achievable at Diamond are sub 100 nanometre. Achieving such small focused X-ray beams places great demands on the quality of the X-ray focusing optics. The Optics Group at Diamond are developing micro-fabricated refractive optical components to correct for the fabrication errors in X-ray focusing optical components with the potential to obtain X-ray focal spots sizes of less than 10 nanometre in size. This would be of great benefit to the cutting edge experiments performed at the synchrotron.
The successful applicant will participate in the design and fabrication of this novel X-ray optics; evaluation of the optics, in particular performing sensitive measurements to characterise the new optics on B16, the Test Beamline. At Oxford, the student will become a member of Prof. Korsunsky’s group (MBLEM).
Applications should be made directly to University of Oxford, details here.
Informal enquiries are encouraged and should be addressed to Professor Alexander Korsunsky (firstname.lastname@example.org).
To apply formally for this studentship, candidates should send the following documents to email@example.com:
- Covering letter (explaining your suitability for the study, what you hope to achieve from the DPhil and your research experience to date)
- Contact details for two academic or professional referees
Start in October 2017.
Application deadline: Friday 28th July, 2017, Interviews will be held in mid-August, 2017.
The last decade has seen a tremendous evolution of X-ray imaging and microscopy. This has been driven by the rapid development of third and fourth generation X-ray facilities and X-ray optics capable of producing coherent beams routinely below 100 nm in size. The high penetrating power, extreme sensitivity of X-rays to strain and defects and the tunability of these new sources to access X-ray fluorescence of much of the periodic table has enabled in situ or operando studies of nano-scale properties materials. It is worth also emphasizing that small X-ray beams may also be used to induce an electrical current or light emission in the nano-object enabling enhanced scanning probe and photo excitation studies.
Beyond a discussion of the methods which have been developed, and are still an object of active research (coherent diffraction imaging in forward or Bragg conditions, nano X-ray fluorescence imaging, micro-Laue diffraction …), this symposium aims to disseminate knowledge of these new tools to a broader community of materials scientists.
Call for Papers:
Abstract submission opens: September 29th 2017.
Abstract submission deadline: October 31st 2017.
More information can be found in the following link: www.mrs.org/spring2018, and in the document below: