• EMMC16 ( 16th European Mechanics of Materials Conference) aims at gathering researchers sharing a common interest in the field of mechanics of materials, yet working in a variety of application domains : material science, mechanical and civil engineering, but also biomechanics, geophysics, ...

    Session 17 focus on Coupled experimental-numerical approaches in Materials characterization  :

    To understand and predict the mechanical behavior of metallic materials, an in-depth understanding of the dominant mechanisms operating at different length scales is needed. This involves going from the atomic scale of dislocation cores to the nanometer and micrometer scales characteristic of the microstructure, all together responsible for the macroscopic mechanical behavior. Such widespread knowledge can only be gathered through a constant dialogue between experiments and simulations; dialogue, which has lately been promoted thanks to the development of advanced mechanical models and new experimental settings. In this session, the interplay between experimental observations and predictive models at the nano- and micron-scales is a central theme. We encourage contributions that directly couple experimental and numerical approaches at the same or different length scale.

    Topics of interest include, but are not limited to:

    • Micro and Meso deformation experiments and simulations
    • Dislocation mechanisms and their observations
    • Fracture mechanisms and related experiments
    • Micromechanical constitutive laws and their validation against experiments
    • Modeling and experimental observations of phase transformations

    This session is organized by Helena Van Swygenhoven (EPFL, Lausanne, Swiss) and David Rodney (UL, Lyon, France).

    Abstract submission deadline: September 30, 2017.

    More information are available to the following link : https://emmc16.sciencesconf.org/

         
         

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  • Le Groupe des Utilisateurs de Microscopie électronique Philips-FEI (GUMP) attache une importance toute particulière à faire interagire, entre elle, la comunauté des microscopistes francophones. Chercheurs ou industriels, physiciens ou biologistes parlent tous des langues différentes, mais arrivent à se rassembler autour de la même technique: La microscopie.

    La prochaine réunion se déroulera à Metz du Jeudi 19 Octobre 2017 (8H30) au Vendredi 20 Octobre 2017 (12H30), et la thématique abordée sera la microscopie in-situ. De nombreux conférenciers, experts dans leur domaine, vous présenteront leurs travaux et/ou leurs développements pour vous faire voyager des mécanismes de la structure de la matière inerte, à la complexité du vivant.

    Le programme et les formalités d'inscription sont accessible, en suivant le lien: http://gump.microscopie.org/


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  • This regular symposium was created two years ago in order to expand the scope of the International Conference on Metallurgical Coatings and Thin Films (ICMCTF) to micromechanical and small-scale characterization method, and has enjoyed lasting popularity ever since. The symposium is widely opened to contributions from the fiels of nanoindentation, FIB-Based techniques, TEM, X-Ray methods, Atom Probe Tomography, testing in non-ambient conditions...

    For the upcoming meeting, it will be our pleasure to welcome following invited speakers:

    Daniel Kiener, Montanuniversität Leoben, Austria
    “In-situ Study of Deformation and Fracture Processes in Nanostructured Metals at Elevated Temperatures”

    Karsten Durst, Technische Universität Darmstadt, Germany
    “Recent Advances in Micro-cantilever In-situ Bending Experiments”

    Megan Cordill, Erich Schmid Institute, Austria
    “In-situ-squared: Combined Electro-mechanical Behavior of Thin Films with One Experiment”

    Suneel Kodambaka, University of California, Los Angeles, USA
    “In-situ Nanomechanical Characterization of Transition Metal Carbides” 

    You are welcome to submit a contribution in one of our three sessions:

    H1. Spatially-resolved Characterization of Thin Films and Engineered Surfaces

    H2. Advanced Mechanical Testing of Surfaces, Thin Films, and Coatings

    H3. Characterization of Coatings in Harsh Environments

    Submissions are opened until October 1, 2017 at:

    http://www2.avs.org/conferences/ICMCTF/2018/index.htm

    For further details, contact:

    Benoit Merle, Friedrich-Alexander University Erlangen-Nürnberg, Germany, benoit.merle@fau.de

    Marco Sebastiani, Roma TRE University, Italy, marco.sebastiani@uniroma3.it


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  • The focus of the International GRK 1896 Satellite Symposium “In Situ Microscopy with Electrons, X-rays and Scanning Probes” at the ICEAM2017 lies on recent advances in the direct study of material processes under the influence of external stimuli such as temperature, mechanical strain, magnetic/electric fields and chemical environments and their simulation by scale-bridging modeling techniques. The symposium aims to provide a forum for discussion between researchers from the University of Erlangen-Nürnberg and abroad and distinguished invited experts, to promote the interdisciplinary exchange of new developments in the rapidly evolving field of complementary in situ microscopy and simulation techniques.

    Contact:
    Chair of Micro- and Nanostructure Research
    Prof. Erdmann Spiecker

    Dr. Christian Wiktor
    Phone: +49 9131 85-64065
    E-mail: christian.wiktor@fau.de

    Abstract submission deadline: August 31st, 2017.

    More information concerning the symposium and registration can be found here.


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  • Subject: Characterization and Modeling of Dopant Diffusion Under Process-Induced Stress.

    The aim of the PhD is to reliably predict the impact of manufacturing process-induced stress on junction profile modification subsequent electrical parameters shifts on sub-micrometric electronic active devices. The job will involve physical and electrical characterization of dedicated, previously designed simple test structures with a view to assessing the nature and magnitude of mechanical stress and dopant diffusion. A critical review and improvement (if necessary) of state-of-the-art stress-dependent dopant diffusion models will pave the way to an accurate Technology Computer Aided Design (TCAD) simulation of realistic (that is, manufactured) electronic devices.

    It will be performed in strong partnership with STMicroelectronics. 

    Candidate profile:   
    The ideal candidate has a Master Degree in Material Sciences (or equivalent), a solid background in semiconductor physics, good communication skills and is proficient in written and spoken English.

    Deadline : September 2017   
    Starting year : 2017   
    PhD Advisor : Pr. Olivier Thomas, Email : olivier.thomas@im2np.fr   
    Laboratory : IM2NP (http://www.im2np.fr/)   
    Industry : STMicroelectronics, Rousset–France (http://www.st.com)   
    Funding : CIFRE  (3 years)   
    Location : Marseille (France), Rousset (France)

    Applications should be sent by email to Prof. Olivier THOMAS (olivier.thomas@im2np.fr) and/or Dr. Roberto SIMOLA (roberto.simola@st.com).

    More information on the subject can be found in the document below:

     

     


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