The Laboratoire d’Étude des Microstructures et de Mécanique des Matériaux (LEM3) in France and The Centre Interdisciplinaire de Microscopie Électronique (CIME) in Switzerland are looking for a 12 month Postdoc for Characterization and 3D reconstruction of deformation defects in TiAl based alloys observed by Scanning Electron Microscopy (SEM), to support their research.

Your tasks:

- You will perform detailed analyses of deformation microstructures.

- You will mainly work with SEM. You will develop and explore cutting-edge techniques for characterizing defects.

- You will interact with computer scientists, engineers and researchers from several countries.

- You will share your time between Metz (France) and Lausanne (Switzerland).

- Your results will be discussed in the framework of materials plasticity particularly on TiAl based alloys.

Your profile:

- You should be a PhD in materials science. (PhD defense in 2014, 2015, 2016 or 2017)

- You should have good knowledge of deformation physics and plasticity of materials.

- Experience with electron microscopes is expected.

- As you will be part of international teams, good communication skills in English and teamwork practices are expected.

For further information and application, please contact:

Dr. Antoine GUITTON
antoine.guitton@univ-lorraine.fr
+33 372 747 787

More information are available on the document below :

EMMC16 ( 16th European Mechanics of Materials Conference) aims at gathering researchers sharing a common interest in the field of mechanics of materials, yet working in a variety of application domains : material science, mechanical and civil engineering, but also biomechanics, geophysics, ...

Session 17 focus on Coupled experimental-numerical approaches in Materials characterization  :

To understand and predict the mechanical behavior of metallic materials, an in-depth understanding of the dominant mechanisms operating at different length scales is needed. This involves going from the atomic scale of dislocation cores to the nanometer and micrometer scales characteristic of the microstructure, all together responsible for the macroscopic mechanical behavior. Such widespread knowledge can only be gathered through a constant dialogue between experiments and simulations; dialogue, which has lately been promoted thanks to the development of advanced mechanical models and new experimental settings. In this session, the interplay between experimental observations and predictive models at the nano- and micron-scales is a central theme. We encourage contributions that directly couple experimental and numerical approaches at the same or different length scale.

Topics of interest include, but are not limited to:

• Micro and Meso deformation experiments and simulations
• Dislocation mechanisms and their observations
• Fracture mechanisms and related experiments
• Micromechanical constitutive laws and their validation against experiments
• Modeling and experimental observations of phase transformations

This session is organized by Helena Van Swygenhoven (EPFL, Lausanne, Swiss) and David Rodney (UL, Lyon, France).

Abstract submission deadline: September 30, 2017.

More information are available to the following link : https://emmc16.sciencesconf.org/

Le Groupe des Utilisateurs de Microscopie électronique Philips-FEI (GUMP) attache une importance toute particulière à faire interagire, entre elle, la comunauté des microscopistes francophones. Chercheurs ou industriels, physiciens ou biologistes parlent tous des langues différentes, mais arrivent à se rassembler autour de la même technique: La microscopie.

La prochaine réunion se déroulera à Metz du Jeudi 19 Octobre 2017 (8H30) au Vendredi 20 Octobre 2017 (12H30), et la thématique abordée sera la microscopie in-situ. De nombreux conférenciers, experts dans leur domaine, vous présenteront leurs travaux et/ou leurs développements pour vous faire voyager des mécanismes de la structure de la matière inerte, à la complexité du vivant.

Le programme et les formalités d'inscription sont accessible, en suivant le lien: http://gump.microscopie.org/