• ICMCTF 2020 - Focus on symposium H and E, San Diego, California, USA, 26 April - 1 May 2020

    The International Conference on Metallurgical Coatings and Thin Films (ICMCTF) is the premier international conference in the field of thin film deposition , characterization , and advanced surface engineering. Focus on two symposium:

    Symposium H: Advanced Characterization Techniques for Coatings, Thin Films, and Small Volumes

    Chairs: Benoit Merle (University Erlangen-Nürnberg (FAU), Germany) and Marco Sebastiani (Roma TRE University, Italy)

    This symposium focuses on recent advances in the structural, microstructural, and mechanical characterization of coatings and thin films, which enhance our understanding of the growth and surface modification processes as well as the fundamental structure-property-processing relationships. Of interest are contributions that either highlight the application of, or draw attention to, recent advances in analytical methods, characterization techniques, and novel nano-mechanical testing methods for coating evaluation. Analytical methods may include numerical evaluation and quantification procedures (e.g., factor analysis, depth profiling, 3D mapping, etc.) to reveal the micro- and nano-structure, chemical composition, residual stress, chemical states, and phases of coatings, thin films, interfaces, and surfaces during or after surface modification. Micro- and nanomechanical methods may include compression, bending, or toughness testing to determine coating behavior, particularly at elevated/service temperatures and in harsh environments, and the relationship to coating performance and lifetime. Residual stress analysis, phase characterization, surface topography probes, compositional analysis, high-resolution spatial imaging and analysis, and hardness measurements continue to be subjects of interest in the sessions. In-situ characterization methods and other novel techniques presenting the combination between microstructural nano-mechanical probes are highly encouraged.

    • H1: Spatially-resolved and In-Situ Characterization of Thin Films and Engineered Surfaces
    • H2: Advanced Mechanical Testing of Surfaces, Thin Films, Coatings and Small Volumes
    • H3: Characterization of Coatings and Small Volumes in Harsh Environments

     

    Symposium E: Tribology and Mechanical Behavior of Coatings and Engineered Surfaces

    Particular focus on:

    E2: Mechanical Properties and Adhesion:

    This session is devoted to the measurement and modeling of mechanical properties of surface and near-surface regions of thin films, coatings, and surface-engineered bulk materials. We are interested in measurement methods and models for the quantitative determination of mechanical properties, residual stresses, interface adhesion, fatigue, and fracture toughness. Emphasis will be given to contributions on novel test methods, such as in situ testing in SEM or TEM, multi-axial contact mechanics, MEMS test beds, and new approaches for the extraction of mechanical and constitutive properties by modeling of indentation load-displacement curves. Finally, special consideration will be given to contributions that address processing-structure- mechanical property relationships across multiple length scales.

    Invited Speakers: Bo-Shiuan Li (University of Oxford, UK) and Corinne Packard (Colorado School of Mines, USA, “Controlled Spalling of Microscale, Single-Crystal Films of High-Quality, High-Value Semiconductors”)

     

    Call for Abstracts Deadline: October 1, 2019

    For more information, and submission please follow the link: icmctf2020.avs.org


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