The last decade has seen a tremendous evolution of X-ray imaging and microscopy. This has been driven by the rapid development of third and fourth generation X-ray facilities and X-ray optics capable of producing coherent beams routinely below 100 nm in size. The high penetrating power, extreme sensitivity of X-rays to strain and defects and the tunability of these new sources to access X-ray fluorescence of much of the periodic table has enabled in situ or operando studies of nano-scale properties materials. It is worth also emphasizing that small X-ray beams may also be used to induce an electrical current or light emission in the nano-object enabling enhanced scanning probe and photo excitation studies.
Beyond a discussion of the methods which have been developed, and are still an object of active research (coherent diffraction imaging in forward or Bragg conditions, nano X-ray fluorescence imaging, micro-Laue diffraction …), this symposium aims to disseminate knowledge of these new tools to a broader community of materials scientists.
Call for Papers:
Abstract submission opens: September 29th 2017.
Abstract submission deadline: October 31st 2017.
More information can be found in the following link: www.mrs.org/spring2018, and in the document below:
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