• Le Groupe des Utilisateurs de Microscopie électronique Philips-FEI (GUMP) attache une importance toute particulière à faire interagire, entre elle, la comunauté des microscopistes francophones. Chercheurs ou industriels, physiciens ou biologistes parlent tous des langues différentes, mais arrivent à se rassembler autour de la même technique: La microscopie.

    La prochaine réunion se déroulera à Metz du Jeudi 19 Octobre 2017 (8H30) au Vendredi 20 Octobre 2017 (12H30), et la thématique abordée sera la microscopie in-situ. De nombreux conférenciers, experts dans leur domaine, vous présenteront leurs travaux et/ou leurs développements pour vous faire voyager des mécanismes de la structure de la matière inerte, à la complexité du vivant.

    Le programme et les formalités d'inscription sont accessible, en suivant le lien: http://gump.microscopie.org/


    votre commentaire
  • This regular symposium was created two years ago in order to expand the scope of the International Conference on Metallurgical Coatings and Thin Films (ICMCTF) to micromechanical and small-scale characterization method, and has enjoyed lasting popularity ever since. The symposium is widely opened to contributions from the fiels of nanoindentation, FIB-Based techniques, TEM, X-Ray methods, Atom Probe Tomography, testing in non-ambient conditions...

    For the upcoming meeting, it will be our pleasure to welcome following invited speakers:

    Daniel Kiener, Montanuniversität Leoben, Austria
    “In-situ Study of Deformation and Fracture Processes in Nanostructured Metals at Elevated Temperatures”

    Karsten Durst, Technische Universität Darmstadt, Germany
    “Recent Advances in Micro-cantilever In-situ Bending Experiments”

    Megan Cordill, Erich Schmid Institute, Austria
    “In-situ-squared: Combined Electro-mechanical Behavior of Thin Films with One Experiment”

    Suneel Kodambaka, University of California, Los Angeles, USA
    “In-situ Nanomechanical Characterization of Transition Metal Carbides” 

    You are welcome to submit a contribution in one of our three sessions:

    H1. Spatially-resolved Characterization of Thin Films and Engineered Surfaces

    H2. Advanced Mechanical Testing of Surfaces, Thin Films, and Coatings

    H3. Characterization of Coatings in Harsh Environments

    Submissions are opened until October 1, 2017 at:

    http://www2.avs.org/conferences/ICMCTF/2018/index.htm

    For further details, contact:

    Benoit Merle, Friedrich-Alexander University Erlangen-Nürnberg, Germany, benoit.merle@fau.de

    Marco Sebastiani, Roma TRE University, Italy, marco.sebastiani@uniroma3.it


    votre commentaire
  • The focus of the International GRK 1896 Satellite Symposium “In Situ Microscopy with Electrons, X-rays and Scanning Probes” at the ICEAM2017 lies on recent advances in the direct study of material processes under the influence of external stimuli such as temperature, mechanical strain, magnetic/electric fields and chemical environments and their simulation by scale-bridging modeling techniques. The symposium aims to provide a forum for discussion between researchers from the University of Erlangen-Nürnberg and abroad and distinguished invited experts, to promote the interdisciplinary exchange of new developments in the rapidly evolving field of complementary in situ microscopy and simulation techniques.

    Contact:
    Chair of Micro- and Nanostructure Research
    Prof. Erdmann Spiecker

    Dr. Christian Wiktor
    Phone: +49 9131 85-64065
    E-mail: christian.wiktor@fau.de

    Abstract submission deadline: August 31st, 2017.

    More information concerning the symposium and registration can be found here.


    votre commentaire
  • Subject: Characterization and Modeling of Dopant Diffusion Under Process-Induced Stress.

    The aim of the PhD is to reliably predict the impact of manufacturing process-induced stress on junction profile modification subsequent electrical parameters shifts on sub-micrometric electronic active devices. The job will involve physical and electrical characterization of dedicated, previously designed simple test structures with a view to assessing the nature and magnitude of mechanical stress and dopant diffusion. A critical review and improvement (if necessary) of state-of-the-art stress-dependent dopant diffusion models will pave the way to an accurate Technology Computer Aided Design (TCAD) simulation of realistic (that is, manufactured) electronic devices.

    It will be performed in strong partnership with STMicroelectronics. 

    Candidate profile:   
    The ideal candidate has a Master Degree in Material Sciences (or equivalent), a solid background in semiconductor physics, good communication skills and is proficient in written and spoken English.

    Deadline : September 2017   
    Starting year : 2017   
    PhD Advisor : Pr. Olivier Thomas, Email : olivier.thomas@im2np.fr   
    Laboratory : IM2NP (http://www.im2np.fr/)   
    Industry : STMicroelectronics, Rousset–France (http://www.st.com)   
    Funding : CIFRE  (3 years)   
    Location : Marseille (France), Rousset (France)

    Applications should be sent by email to Prof. Olivier THOMAS (olivier.thomas@im2np.fr) and/or Dr. Roberto SIMOLA (roberto.simola@st.com).

    More information on the subject can be found in the document below:

     

     


    votre commentaire
  • EMMC16 ( 16th European Mechanics of Materials Conference) aims at gathering researchers sharing a common interest in the field of mechanics of materials, yet working in a variety of application domains : material science, mechanical and civil engineering, but also biomechanics, geophysics, ...

    Session 15 focus on Experimental nanomechanics :

    Nano- and micromechanical testing coupled with advanced in situ techniques has attracted significant attention over the past decade because it permits (i) probing individual microstructure constituents and (ii) selectively activate mechanisms. Both is key to fundamentally understand plasticity and fracture of advanced multi-phase microstructures and small scale systems. The main objective of this thematic session is to gather specialists in the field of Nano- and Micromechanical testing to unravel mechanisms of plasticity and fracture at interfaces.

    Characterization techniques envisioned comprise (but are not limited to) transmission electron microscopy (TEM), scanning electron microscopy (SEM) and synchrotron based techniques. The contributions should aim for understanding plasticity, fracture and fatigue at

    • grain and phase boundaries
    • amorphous / crystalline interfaces
    • free surfaces
    • multilayered systems
    • super lattices.

    This session is organized by Christoph Kirchlechner (MPIE, Düsseldorf, Germany) and Frédéric Mompiou (CEMES, Toulouse, France).

    Abstract submission deadline: September 30, 2017.

    More information are available to the following link : https://emmc16.sciencesconf.org/

     


    votre commentaire