PhD subject: "Characterization and Modeling of Phase-Change Materials for Advanced Embedded Memory Applications."

Description: This PhD work will investigate in situ the structural change of these materials during heat treatment using various advanced X-ray scattering techniques (laboratory or synchrotron radiation facilities). These advanced experiments and their modeling by finite element-based methods will bring invaluable information on the physical mechanisms at work during crystallization (nucleation and growth of crystalline phases, stress development and relaxation...).

Aside from X-ray scattering additional input will be obtained from complementary techniques available from the partners (IM2NP/STM/CEA-LETI) involved in the PhD project such as transmission electron microscopy, Raman/FTIR/X-Ray Photoelectron spectroscopy, resistivity/reflectivity/ellipsometry vs temperature...). Thanks to the high penetrating power of x-rays dedicated deviceswill, in the longer term, be developed for operando real time investigations of memory cells during operations like set and reset at synchrotrons or XFELs.

Candidate profile: The ideal candidate holds a master’s degree in Material Sciences (or equivalent), has a solid background in physics, good communication skills and is proficient in written and spoken English. Knowledge of solid mechanics and programming skills will be appreciated.

Information:

Deadline: June 30th, 2019

Starting year: 2019

PhD Advisor: Prof. Olivier Thomas

Laboratory: IM2NP (http://www.im2np.fr/)

Industry: STMicroelectronics, Crolles/Rousset–France (http://www.st.com)

Funding: CIFRE (3 years)

Location: IM2NP-Marseille(60%), STM-Crolles/Rousset(20%) and CEA-LETI-Grenoble(20%)

Application: Applications including a CV and letter of motivation should be sent by email Prof. Olivier THOMAS (olivier.thomas@im2np.fr) and Philippe Boivin (philippe.boivin@st.com).

Further information in the following document: « 2019_STMicroelectronics_IM2NP_CEA_PhD_PCM_Charac.pdf »