Call for Papers: Advanced Nanomechanical Testing
Advanced Nanomechanical Testing
Focus Issue: Journal of Materials Research
Issue Date: March 28, 2021
Submission Deadline: August 14, 2020
Small-scale mechanical characterization is essential for ensuring the service performance and lifetime of small components, such as thin films and coatings, electronic sensors, and MEMS. The first mechanical measurements on the submicrometer scale were enabled by the development of nanoindentation in the 1980s. JMR has long been the flagship journal for this field. In addition to countless contributed articles, previous Focus Issues published over the past two decades have disseminated the latest in method developments and trends in the field.
In addition to providing a long-expected update, this Focus Issue will expand the scope of nanomechanical testing methods beyond classical nanoindentation. Recent years have seen numerous attempts to access specific materials parameters and to better account for the typical operational conditions of the sample of interest. We therefore welcome contributions related to, but not limited to, focused ion beam (FIB) enabled methods, complex loading conditions, in-situ testing, and testing in extreme environments. Application of nanomechanical testing methods to new types of materials are also encouraged. This Focus Issue is a unique opportunity to highlight and share recent significant developments and achievements with the greater nanomechanics community.
Contributing papers are solicited in the following areas:
• Nanoindentation, micromechanical, and nanomechanical testing
• New developments, e.g., for the acquisition of the full stress-strain response
• Application to new types of materials
• Complex loading conditions (cyclic fatigue, fracture testing)
• Extreme testing environments (high and low temperatures, irradiation, high strain rates)
• In-situ testing (in scanning electron microscope, transmission electron microscope, or synchrotron)
Guest editors :
Benoit Merle, University Erlangen-Nuremberg (FAU), Germany
Verena Maier-Kiener, Montanuniversitaet Leoben, Austria
Timothy J. Rupert, University of California, Irvine, USA
George M. Pharr, Texas A&M University, USA
To be considered for this issue, new and previously unpublished results or review articles significant to the development of this field should be presented. The manuscripts must be submitted via the JMR electronic submission system by August 14, 2020. Manuscripts submitted after this deadline will not be considered for the issue due to time constraints on the review process. Please select “Advanced Nanomechanical Testing” as the Focus Issue designation. Note our manuscript submission minimum length of 3250 words, excluding figures, captions, and references, with at least 6 and no more than 10 figures and tables combined. Review articles may be longer but must be pre-approved by proposal to the Guest Editors via email@example.com. The proposal form and author instructions may be found at www.mrs.org/jmr-instructions. All manuscripts will be reviewed in a normal but expedited fashion. Papers submitted by the deadline and subsequently accepted will be published in the Focus Issue. Other manuscripts that are acceptable but cannot be included in the issue will be scheduled for publication in a subsequent issue.
Please direct questions to firstname.lastname@example.org.
CommentsNo comments yet
Suivre le flux RSS des commentaires